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Giannuzzi, L.A. (2018) Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN: 978-1-4939-6674-5. Microscopy and Microanalysis, 24, 768-768.
https://doi.org/10.1017/s1431927618015271

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