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Stjerna, B., Granqvist, C.G., Seidel, A. and Häggström, L. (1990) Characterization of Rf-Sputtered SnOx Thin Films by Electron Microscopy, Hall-Effect Measurement, and Mössbauer Spectrometry. Journal of Applied Physics, 68, 6241-6245.
https://doi.org/10.1063/1.346889

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