Article citationsMore>>

Zheng, X., Bao, J. and Zhu, C. (2014) Robustness of Cell System under Electro-Magnetic Field Disturbance. High Voltage Technology, 40, 3837-3845. (In Chinese)

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top