Article citationsMore>>

Kim, T., Yoon, Y., Lee, B., Ham, N. and Kim, J. (2022) Cost-Benefit Analysis of Scan-Vs-BIM-Based Quality Management. Buildings, 12, Article 2052.
https://doi.org/10.3390/buildings12122052

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top