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B. D. Cullity, “Elements of X-Ray Diffraction,” 2nd Edition, Addison Wesley, New York, 1978, pp. 155-165.

has been cited by the following article:

• TITLE: Structural Characterization of Nanocrystalline La1-xSrxCrO3 Thick Films for H2S Gas Sensors

  AUTHORS: Ashish V. Kadu, Archana B. Bodade, Anjali B. Bodade, G. N. Chaudhari

  KEYWORDS: La1-xSrxCrO3; H2S Gas; Selectivity; Response & Recovery Time

  JOURNAL NAME: Journal of Sensor Technology, Vol.2 No.1, March 19, 2012

  ABSTRACT: The nanocrystalline of La1-xSrxCrO3 (x = 0.0, 0.1, 0.2, 0.3 & 0.4) were prepared by sol-gel method and their crystal structures & morphology were characterized by X-ray diffraction (XRD) and Transmission Electron Microscopy (TEM). XRD patterns indicate that the average particle size of the nanocrystalline La0.7Sr0.3CrO3in the range of 30 - 35 nm. The gas sensing properties were studied towards reducing gases like Ammonia gas (NH3), liquefied petroleum gas (LPG), hydrogen sulphide (H2S) and H2 gas and it is observed that undoped LaCrO3 shows response to H2S gas at relatively high operating temperature 300°C. The La1-xSrxCrO3 based sensor with x = 0.3 shows better sensitivity towards H2S gas at an operating temperature 210°C. The effect of Sr doping on sensitivity, response time and recovery time of the sensor in the presence of H2S and other reducing gases were studied and discussed.