Article citationsMore>>

Li, Q., Liu, Y., Sun, S., Qin, Z. and Chu, F. (2024) Deep Expert Network: A Unified Method toward Knowledge-Informed Fault Diagnosis via Fully Interpretable Neuro-Symbolic AI. Journal of Manufacturing Systems, 77, 652-661.
https://doi.org/10.1016/j.jmsy.2024.10.007

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top