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P. Frach, K. Goedicke, C. Gottfried and H. Bartzsch, “A Versatile Coating Tool for Reactive In-Line Sputtering in Different Pulse Modes”, Surface and Coatings Technology, Vol. 142-144, 2001, pp. 628-634. doi:10.1016/S0257-8972(01)01152-5

has been cited by the following article:

• TITLE: Sensitive and Reproducible Photocatalytic Activity Evaluation Instrument for Transparent Coatings

  AUTHORS: Masayuki Kamei

  KEYWORDS: TiO2; Coatings; Photo-Catalysis

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.2 No.1, February 28, 2012

  ABSTRACT: A new photocatalytic activity (PC) measurement instrument based on the measurement of the photo-induced reduction of Ag ions was proposed. The feature of this system is to perform “ultraviolet irradiation for PC activation” and “Ag film thickness determination for PC evaluation” simultaneously and automatically. Realizing a PC measurement system with high sensitivity, wide dynamic range, easy operation and reproducibility, which is especially suited for the PC measurement of the coatings on transparent substrates.