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Y. Bharath Kumar Reddy and V. Sundara Raja, “Optical and structural Properties of Co-Evaporated CuIn_0.5Al_0.5Se₂ Thin Films,” Semiconductor Science and Technology, Vol. 19, No. 8, 2004, pp. 1015-1019. doi:10.1088/0268-1242/19/8/011

has been cited by the following article:

• TITLE: Determination of Optimum Film Thickness and Composition of Cu(InAl)Se2 Thin Films as anAbsorber for Solar Cell Applications

  AUTHORS: Balakrishnan Kavitha, Muthusamy Dhanam

  KEYWORDS: CBD, XRD, EDAX, CIAS Thin Films

  JOURNAL NAME: World Journal of Nano Science and Engineering, Vol.1 No.4, December 9, 2011

  ABSTRACT: Cu(InAl)Se2 [CIAS] thin films have been prepared by chemical bath deposition [CBD] technique. X-ray diffraction [XRD] and Energy dispersive X-ray analysis [EDAX] spectra have been employed to confirm the structure and composition of the prepared films. The structural parameters have been estimated from XRD and EDAX spectra and their variation with film thickness and composition has been discussed in this paper in detail. From the discussion we enabled to find the optimum film thickness and composition of CIAS thin films for solar cell applications.