Article citationsMore>>

J. X. Hao, C. E. Cho, G. Scardera, E. Bellet-Amalric, D. Bellet, Y. S. Shen, S. Huang, Y. D. Huang, G. Conibeer and M. A. Green, “Effects of Phosphorus Doping on Stru- ctural and Optical Properties of Silicon Nanocrystals in a SiO2 Matrix,” Thin Solid Films, Vol. 517, No. 19, 2009, pp. 5646-5652. doi:10.1016/j.tsf.2009.02.076

has been cited by the following article:

• TITLE: Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

  AUTHORS: Inas Battisha, Amany El Nahrawy

  KEYWORDS: Sol-Gel; Nano-Structure SiO2P2O5 Thin Film; Scanning Electron Microscopy (SEM); XRD and FTIR

  JOURNAL NAME: New Journal of Glass and Ceramics, Vol.2 No.1, January 12, 2012

  ABSTRACT: A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).