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Wang, J., Dong, G., Sun, J., Wang, X. and Zhang, P. (2019) Adversarial Sample Detection for Deep Neural Network through Model Mutation Testing. 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), Montreal, 25-31 May 2019, 1245-1256.
https://doi.org/10.1109/icse.2019.00126

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