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Demirezen, S. (2019) The Role of Interface Traps, Series Resistance and (Ni-Doped PVA) Interlayer Effects on Electrical Characteristics in Al/p-Si (MS) Structures. Journal of Materials Science: Materials in Electronics, 30, 19854-19861.
https://doi.org/10.1007/s10854-019-02352-3

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