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S. Bartkowski, M. Neumann, E. Z. Kurmaev, V. V. Fedorenko, S. N. Shamin, V. M. Cherkashenko and S. N. Nemnonov, A. Winiarski, D. C. Rubie, “Electronic Structure of Titanium Monoxide,” Physical Review B, Vol. 56, No. 16, 1997, pp. 10656-10667. doi:10.1103/PhysRevB.56.10656

has been cited by the following article:

• TITLE: Surface Characterization of Titanium Implants Treated in Hydrofluoric Acid

  AUTHORS: Danila M. Korotin, Stefan Bartkowski, Ernst Z. Kurmaev, Manfred Meumann, Eugeniya B. Yakushina, Ruslan Z. Valiev, Seif O. Cholakh

  KEYWORDS: Commercially Pure Titanium; Surface Composition; Hydrofluoric Acid; Surface Characterization; Biocompatibility

  JOURNAL NAME: Journal of Biomaterials and Nanobiotechnology, Vol.3 No.1, January 12, 2012

  ABSTRACT: The results of XPS measurements of commercially pure titanium cp-Ti) before and after chemical treatment are presented. We have measured XPS spectra of core levels (Ti 2p, O 1s, C 1s, F 1s) and valence bands of coarse-grained cp-Ti before and after standard acid treatment accepted in dentistry (in 1% HF and 40% HF for 1 min). It is found, that acid treatment of cp-Ti reduces the content of hydrocarbons increasing the surface energy and bio-compatibility of Ti-implants. On the other hand, it is fixed that oxygen concentration on the surface of the acid treated cp-Ti is much higher than for the untreated sample, because the acid treatment removes the contaminated surface layers, increases their reactivity, provides a better passivation and formation of thick protecting TiO2 layer.