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C. Sonnichsen, S. Geier, N. E. Hecker, G. von Plessen, J. Feldmann, H. Ditlbacher, B. Lamprecht, J. R. Krenn, F. R. Aussenegg, V. Z. H. Chan, J. P. Spatz and M. Moller, “Spectroscopy of Single Metallic Nanoparticles Using Total Internal Reflection Microscopy,” Applied Physics Letters, Vol. 77, No. 19, 2000, pp. 2949-2951. doi:10.1063/1.1323553

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