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Pauwels, B., Yandouzi, M., Schryvers, D., Tendeloo, G.V., Verschoren, G., Lievens, P., et al. (2000) Atomic Scale Characterization of Supported and Assembled Nanoparticles. MRS Online Proceedings Library, 634, Article No. 831.
https://doi.org/10.1557/proc-634-b8.3.1

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