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Delhez, R., de Keijser, T.H. and Mittemeijer, E.J. (1982) Determination of Crystallite Size and Lattice Distortions through X-Ray Diffraction Line Profile Analysis. Fresenius Zeitschrift für Analytische Chemie, 312, 1-16.
https://doi.org/10.1007/bf00482725

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