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Verspecht, J., Horn, J., Betts, L., Gunyan, D., Pollard, R., Gillease, C. and Root, D.E. (2009) Extension of X-Parameters to Include Long-Term Dynamic Memory Effects. 2009 IEEE MTT-S International Microwave Symposium Digest, Boston, 7-12 June 2009, 741-744.
https://doi.org/10.1109/MWSYM.2009.5165803

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