Article citationsMore>>

P. Singh and S. Verma, “An Investigation of the Effect of Discretization on Defect Prediction Using Static Measures,” IEEE International Conference on Advances in Computing, Control, and Telecommunication Technologies, 2009, pp. 837-839. doi:10.1109/ACT.2009.212

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top