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Lee, T., Nam, J., Han, D., Kim, S. and In, H.P. (2011) Micro Interaction Metrics for Defect Prediction. Proceedings of the 19th ACM SIGSOFT Symposium and the 13th European Conference on Foundations of Software Engineering, September 2011, 311-321.
https://doi.org/10.1145/2025113.2025156

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