Article citationsMore>>

Kim, S., Zhang, H., Wu, R. and Gong, L. (2011) Dealing with Noise in Defect Prediction. Proceedings of the 33rd International Conference on Software Engineering, Honolulu, 21-28 May 2011, 481-490.
https://doi.org/10.1145/1985793.1985859

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top