Article citationsMore>>

Niu, S.L., Li, B., Wang, X.G., et al. (2020) Defect Image Sample Generation with GAN for Improving Defect Recognition. IEEE Transactions on Automation Science and Engineering, 17, 1611-1622.
https://doi.org/10.1109/TASE.2020.2967415

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top