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N. Stojanovic, J. Yun, E. B. K. Washington, J. M. Berg, M. W. Holtz and H. Temkin, “Thin-Film Thermal Con- ductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analy- sis,” Journal of Microelctromechanical System, Vol. 16, No. 5, 2007, pp. 1269-1275. doi:10.1109/JMEMS.2007.900877

has been cited by the following article:

• TITLE: Effect of Heat Extraction by Metal Lines and Two Sided Cooling on Temperatures in Organic Light Emitting Diode Based Devices

  AUTHORS: Deepak ., Gokaran Nath Shukla

  KEYWORDS: Cooling, Displays, OLED

  JOURNAL NAME: Journal of Electronics Cooling and Thermal Control, Vol.1 No.3, December 16, 2011

  ABSTRACT: Only a 10 K rise in temperature of organic light emitting diode (OLED) can lower its lifetime by more than 50% and cause other performance deterioration. We have performed two dimensional heat transport analysis and calculated temperatures in an OLED panel. The panel temperatures can easily rise in excess of 10 K. Further we have investigated loss of heat through the metal lines for the extent by which they could lower the temperature. However, this method leads to gradients in temperature which could in turn cause inhomogeneities in a display. But, in lighting panels, it will be feasible to cool the devices from both the sides, which is shown to have a significant impact. The thermal transport model presented here for displays is more extensive in its approach and hence likely to provide more accurate results.