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H. Yamada, T. Hasegawa, Y. Ishihara, T. Kiwa and K. Tsukada, “Difference in the Detection Limits of Flaws in the Depths of Multi-Layered and Continuous Aluminum Plates Using Low-Frequency Eddy Current Testing,” NDT&E International, Vol. 41, No. 2, 2008, pp. 108-111. doi:10.1016/j.ndteint.2007.08.004

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