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I. Sychugov, R. Juhasz, A. Galeckas, J. Valenta and J. Linnros, “Single Dot Optical Spectroscopy of Silicon Nanocrystals: Low Temperature Measurements,” Optical Materials, Vol. 27, No. 5, 2005, pp. 973-979. doi:10.1016/j.optmat.2004.08.046

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