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Su, W.H., Zhang, J., Yang, C., Page, R., Szinyei, T., Hirsch, C.D. and Steffenson, B.J. (2021) Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sensing, 13, Article 26.
https://doi.org/10.3390/rs13010026

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