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Choi, J., Park, T., Ryu, J., Jeong, C., Kang, M. and Moon, S. (2023) Advanced Phase Jitter Analysis with Power Noise Induced Jitter Flow in PCIe Gen 3. 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI), Aveiro, 07-10 May 2023, 1-3.
https://ieeexplore.ieee.org/abstract/document/10145553

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