TITLE:
Depth Profile Study of Electroless Deposited Sb2S3 Thin Films Using XPS for Photovoltaic Applications
AUTHORS:
Towhid Adnan Chowdhury
KEYWORDS:
Sb2S3, Depth Profiling, X-Ray Photoelectron Spectroscopy, Thin Film, Electroless
JOURNAL NAME:
Materials Sciences and Applications,
Vol.14 No.7,
July
19,
2023
ABSTRACT: Sb2S3 has gained tremendous research recently for thin film solar cell absorber material because of their easy synthesis, unique electrical and optical properties. The stoichiometry and composition of electroless Sb2S3 thin films were analyzed using XPS depth profile studies. The surface layers were found nearly stoichiometric. On the other hand, the inner layer was rich in antimony composition making it more conductive electrically.