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Rondin, L., Tetienne, J.-P., Spinicelli, P., Dal Savio, C., Karrai, K., Dantelle, G., Thiaville, A., Rohart, S., Roch, J.-F. and Jacques, V. (2012) Nanoscale Magnetic Field Mapping with A Single Spin Scanning Probe Magnetometer. Applied Physics Letters, 100, Article ID: 153118.
https://doi.org/10.1063/1.3703128

has been cited by the following article:

• TITLE: Compensation of Parasitic Capacitance of Quartz Tuning Fork in AFM

  AUTHORS: Yidai Liu

  KEYWORDS: Atomic Force Microscope, Quartz Tuning Fork, Stray Capacitance, Compensator Circuit, PDMS Sample

  JOURNAL NAME: Journal of Applied Mathematics and Physics, Vol.11 No.5, May 30, 2023

  ABSTRACT: We have built an atomic force microscope using a quartz tuning fork as sensor. The excitation method we adopted, the electrical excitation, introduces stray capacitance into the signal-processing circuit. In this report, we demonstrated a simple but effective method to compensate for this parasitic capacitance by adding a compensator circuit consisting of an inverting amplifier and a capacitor. The capacitor is connected in series with the inverting amplifier and the compensator is connected in parallel with the quartz tuning fork. The resonance curve of the system measured after adding the homemade compensator resembles that of a pure RLC circuit, meaning that the stray capacitance is successfully eliminated. Furthermore, we tried to use our equipment to measure PDMS sample and got clean data. This system can be further combined with confocal microscope and diamond with NV defect to build scanning NV magnetometry.