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Kim, J., Jeong, J. and Shin, J. (2020) M2m: Imbalanced Classification via Major-to-Minor Translation. Proceedings of the 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Seattle, WA, 13-19 June 2020, 13893-13902.
https://doi.org/10.1109/CVPR42600.2020.01391.

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