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Caputo, D., De Cerare, G., Irrera, F., Palma, F. and Tucci, M. (1994) Characterization of Intrinsic a-Si:H in p-i-n Devices by Capacitance Measurements: Theory and Experiments. Journal of Applied Physics, 76, 3524-3541.
https://doi.org/10.1063/1.357435

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