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Ebara, S.I., Hirota, Y., Tani, M. and Hangyo, M. (2007) Highly Sensitive Birefringence Measurement in THz Frequency Region and Its Application to Stress Measurement. Proceedings of Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics, Cardiff, 2-9 September 2007, 666-667.
https://doi.org/10.1109/ICIMW.2007.4516673

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