Article citationsMore>>

Madani, M.R. and Ajmera, P.K. (1993) Characterization of Silicon Oxide Films Grown at Room Temperature by Point-to-Plane Corona Discharge. Journal of Electronic Materials, 22, 1147-1152.
https://doi.org/10.1007/BF02817687

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top