Article citationsMore>>

Borgese, L., Zacco, A., Bontempi, E., Colombi, P., Bertuzzi, R. and Ferretti, E. (2009) Total Reflection of X-Ray Fluorescence (TXRF): A Mature Technique for Environmental Chemical Nanoscale Metrology. Measurement Science and Technology, 20, 4-27. https://doi.org/10.1088/0957-0233/20/8/084027

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top