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Gall, D., Haasch, R.T., Finnegan, N., Lee, T.-Y., Shin, C.-S., Sammann, E., Greene, J.E. and Petrov, I. (2000) In Situ X-Ray Photoelectron, Ultraviolet Photoelectron, and Auger Electron Spectroscopy Spectra from First-Row Transition-Metal Nitrides: ScN, TiN, VN, and CrN. Surface Science Spectra, 7, 167-168.
https://doi.org/10.1116/1.1360984

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