TITLE:
Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films
AUTHORS:
Nam Joong Jeon, Jangwon Seo, Yanghee Kim, Ji Yeong Lee, Sugyeong Hong, Sun Hee Kim, Jung-Keun Lee
KEYWORDS:
Perovskite Manganites, FIB, Paramagnetic Spins
JOURNAL NAME:
Advances in Chemical Engineering and Science,
Vol.12 No.2,
March
24,
2022
ABSTRACT: FAMn:PbI3 perovskite films were synthesized and probed mainly through
electron spin resonance (ESR) spectroscopy. FAMn:PbI3 with low (~1%)
Mn concentration showed a hyperfine sextet line originated from Mn++ ions. FAMn:PbI3 with high (10%) Mn concentration showed broad
resonance (~500 G peak-to-peak linewidth).
However, after bombardment of FAMn:PbI3 with high Mn
concentration by focused ion beams (FIB), a sharp ESR peak appeared. The
peak-to-peak linewidth (ΔHpp) was ~8 G regardless of the
temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K -
50 K), which indicates the presence of localized electrons at the defect sites
at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the
temperature increased from 5 K to 50 K. Together with the ongoing search for
electron spin echo (ESE), this could potentially provide a platform for realizing
magnetic bits, information storage, and increased manipulation speed.