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Pearman, D. (2007) Electrical Characterization and Modeling of Schottky Barrier Metal Source/Drain MOSFETS. PhD Thesis, The University of Warwick, Coventry.

has been cited by the following article:

• TITLE: Non Ideal Schottky Barrier Diode’s Parameters Extraction and Materials Identification from Dark I-V-T Characteristics

  AUTHORS: M. Bashahu, D. Ngendabanyikwa, P. Nyandwi

  KEYWORDS: SBD, Dark Forward and Reverse I-V-T Characteristics, Different Parameters Extraction Methods, Identification of the Structure’s Metal and Semiconductor-Type

  JOURNAL NAME: Journal of Modern Physics, Vol.13 No.3, March 9, 2022

  ABSTRACT: Several parameters of a commercial Si-based Schottky barrier diode (SBD) with unknown metal material and semiconductor-type have been investigated in this work from dark forward and reverse I-V characteristics in the temperature (T) range of [274.5 K - 366.5 K]. Those parameters include the reverse saturation current (Is), the ideality factor (n), the series and the shunt resistances (Rs and Rsh), the effective and the zero bias barrier heights (ΦB and ΦB0), the product of the electrical active area (A) and the effective Richardson constant (A**), the built-in potential (Vbi), together with the semiconductor doping concentration (NA or ND). Some of them have been extracted by using two or three different methods. The main features of each approach have been clearly stated. From one parameter to another, results have been discussed in terms of structure performance, comparison on one another when extracted from different methods, accordance or discordance with data from other works, and parameter’s temperature or voltage dependence. A comparison of results on ΦB, ΦB0, n and NA or ND parameters with some available data in literature for the same parameters, has especially led to clear propositions on the identity of the analyzed SBD’s metal and semiconductor-type.