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Petitgas, B., Seytre, G., Gain, O., Boiteux, G., Royaud, I., Serghei, A., Gimenez, A. and Anton, A. (2011) High Temperature Aging of Enameled Copper Wire. Relationships between Chemical Structure and Electrical Behavior. Annual Report on the IEEE Conference on Electrical Insulation and Dielectric Phenomena, Cancun, 16-19 October 2011, 84-88.
https://doi.org/10.1109/CEIDP.2011.6232602

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