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Jayakumar, N., Helle, O.I., Agarwal, K. and Ahluwalia, B. (2020) On-Chip TIRF Nanoscopy by Applying Haar Wavelet Kernel Analysis on Intensity Fluctuations Induced by Chip Illumination. Optics Express, 28, 35454-35468.
https://doi.org/10.1364/OE.403804

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