Article citationsMore>>

Tokas, R., et al. (2016) Effect of Angle of Deposition on Micro-Roughness Parameters and Optical Properties of HfO2 Thin Films Deposited by Reactive Electron Beam Evaporation. Thin Solid Films, 609, 42-48. https://doi.org/10.1016/j.tsf.2016.04.034

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top