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Goldstein, J.I, Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L. and Michael, J. (2003) Scanning Electronmicroscopy and X-Ray Microanalysis. 3rd Edition, Springer, New York.
https://doi.org/10.1007/978-1-4615-0215-9

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