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Fernandez, L., Holzapfel, B., Schindler, F., De Boer, B., Attenberger, A., Hanisch, J. and Schultz, L. (2003) Influence of the Grain Boundary Network on the Critical Current of YBa2Cu3O7 Films Grown on Biaxially Textured Metallic Substrates. Physical Review B, 67, Article ID: 052503.
https://doi.org/10.1103/PhysRevB.67.052503

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