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Papadakis, M., Henard, C., Harman, M., Jia, Y. and Le Traon, Y. (2016) Threats to the Validity of Mutation-Based Test Assessment. Proceedings of the International Symposium on Software Testing and Analysis, Saarbrücken, Germany, 2016, 354-365.
https://doi.org/10.1145/2931037.2931040

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