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Zhou, W., Apkarian, R., Wang, Z.L. and Joy, D. (2006) Fundamentals of Scanning Electron Microscopy (SEM). In: Zhou, W. and Wang, Z.L., Eds., Scanning Microcopy for Nanotechnology, Techniques and Applications, Springer Science Business Media, New York, 1-40.
https://doi.org/10.1007/978-0-387-39620-0_1

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