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Yip, C.W.Y., Ho, J.P.Y., Nikezic, D. and Yu, K.N. (2003) A Fast Method to Measure the Thickness of Removed Layer from Etching of SSNTD Based on EDXRF. Radiation Measurements, 36, 161-164.
https://doi.org/10.1016/S1350-4487(03)00115-X

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