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Georgescu, C., Simion, E., Nita, A.P. and Toma, A. (2017) A View on NIST Randomness Tests (In)Dependence. International Conference on Electronics, Computers and Artificial Intelligence, Targoviste, 29 June-1 July 2017, 1-4.
https://doi.org/10.1109/ECAI.2017.8166460

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