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Hilfiker, J.N., Stadermann, M., Sun, J., Tiwald, T., Hale, J.S., Miller, P.E. and Ruddle, C.A. (2017) Determining Thickness and Refractive Index from Free Standing Ultra-Thin Polymer Films with Spectroscopic Ellipsometry. Applied Surface Science, 421, 508-512.
https://doi.org/10.1016/j.apsusc.2016.08.131

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