Article citationsMore>>

Lu, C.J. and Meeker, W.Q. (1993) Using Degradation Measures to Estimate a Time-to-Failure Distribution. Technometrics, 35, 161-174.
https://doi.org/10.1080/00401706.1993.10485038

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top