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Portail, M., Zielinski, M., Chassagne, T., Chauveau, H., Roy, S. and De Mierry, P. (2009) Highly Sensitive Determination of N+ Doping Level in 3C-SiC and GaN Epilayers by Fourier Transform Infrared Spectroscopy. Materials Science and Engineering: B, 165, 42-46.
https://doi.org/10.1016/j.mseb.2009.03.014

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