Article citationsMore>>

Yadava, G.K., Kuhls-Gilcrist, A.T., Rudin, S., Patel, V.K., Hoffmann, K.R. and Bednarek, D.R. (2008) A Practical Exposure-Equivalent Metric for Instrumentation Noise in X-Ray Imaging Systems. Physics in Medicine & Biology, 53, 5107-5121.
https://doi.org/10.1088/0031-9155/53/18/017

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top