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Dai, J., Zhang, J., Zhang, W. and Grischkowsky, D. (2004) Terahertz Time-Domain Spectroscopy Characterization of the Far-Infrared Absorption and Index of Refraction of High-Resistivity, Float-Zone Silicon. Journal of the Optical Society of America B, 21, 1379.
https://doi.org/10.1364/JOSAB.21.001379

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