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Pristinski, D., Kozlovskaya, V. and Sukhishvili, S.A. (2006) Determination of Film Thickness and Refractive Index in One Measurement of Phase-Modulated Ellipsometry. JOSA A. Journal of the Optical Society of America A, 23, 2639-2644.
https://doi.org/10.1364/JOSAA.23.002639

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